مؤتمر
Assessment of electro-static discharge robustness based on the monitoring of lattice temperature of silicon
| العنوان: | Assessment of electro-static discharge robustness based on the monitoring of lattice temperature of silicon |
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| المؤلفون: | Yoo, K.D., Lim, G.H., Jin, J.H., Choi, K.H. |
| المصدر: | Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures Microelectronic test structures Microelectronic Test Structures, 1994. ICMTS 1994. Proceedings of the 1994 International Conference on. :208-213 1994 |
| Relation: | Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780317572 9780780317574 |
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| DOI: | 10.1109/ICMTS.1994.303474 |