A high performance epitaxial SiGe-base ECL BiCMOS technology

التفاصيل البيبلوغرافية
العنوان: A high performance epitaxial SiGe-base ECL BiCMOS technology
المؤلفون: Harame, D.L., Crabbe, E.F., Cressler, J.D., Comfort, J.H., Sun, J.Y.-C., Stiffler, S.R., Kobeda, E., Burghartz, J.N., Gilbert, M.M., Malinowski, J.C., Dally, A.J., Ratanaphanyarat, S., Saccamango, M.J., Rausch, W., Cotte, J., Chu, C., Stork, J.M.C.
المصدر: 1992 International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International. :19-22 1992
Relation: Proceedings of IEEE International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780308174
9780780308176
تدمد:01631918
DOI:10.1109/IEDM.1992.307299