Efficient path identification for delay testing /spl minus/ time and space optimization

التفاصيل البيبلوغرافية
العنوان: Efficient path identification for delay testing /spl minus/ time and space optimization
المؤلفون: Wittman, H., Henftling, M.
المصدر: Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.. :513-517 1994
Relation: Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0818654104
9780818654107
DOI:10.1109/EDTC.1994.326827