مؤتمر
Efficient path identification for delay testing /spl minus/ time and space optimization
العنوان: | Efficient path identification for delay testing /spl minus/ time and space optimization |
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المؤلفون: | Wittman, H., Henftling, M. |
المصدر: | Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.. :513-517 1994 |
Relation: | Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0818654104 9780818654107 |
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DOI: | 10.1109/EDTC.1994.326827 |