Degradation-free Ta/sub 2/O/sub 5/ capacitor after BPSG reflow at 850/spl deg/C for high density DRAMs

التفاصيل البيبلوغرافية
العنوان: Degradation-free Ta/sub 2/O/sub 5/ capacitor after BPSG reflow at 850/spl deg/C for high density DRAMs
المؤلفون: Kwon, K.W., Park, S.O., Kang, C.S., Kim, Y.N., Ahn, S.T., Lee, M.Y.
المصدر: Proceedings of IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International. :53-56 1993
Relation: Proceedings of IEEE International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780314506
9780780314504
تدمد:01631918
DOI:10.1109/IEDM.1993.347400