مؤتمر
A test chip design for detecting thin film cracking in integrated circuits
| العنوان: | A test chip design for detecting thin film cracking in integrated circuits |
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| المؤلفون: | Gee, S.A., Johnson, M.R., Chen, K.L. |
| المصدر: | 1994 Proceedings. 44th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1994. Proceedings., 44th. :1050-1057 1994 |
| Relation: | 1994 Proceedings. 44th Electronic Components and Technology Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780309146 9780780309142 |
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| DOI: | 10.1109/ECTC.1994.367499 |