مؤتمر
Non-Volatile Memory Technology-Today and Tomorrow
العنوان: | Non-Volatile Memory Technology-Today and Tomorrow |
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المؤلفون: | Chih-Yuan Lu, Tao-Cheng Lu, Liu, R. |
المصدر: | 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :18-23 Jul, 2006 |
Relation: | 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 1424402050 9781424402052 1424402069 9781424402069 |
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تدمد: | 19461542 19461550 |
DOI: | 10.1109/IPFA.2006.250989 |