Non-Volatile Memory Technology-Today and Tomorrow

التفاصيل البيبلوغرافية
العنوان: Non-Volatile Memory Technology-Today and Tomorrow
المؤلفون: Chih-Yuan Lu, Tao-Cheng Lu, Liu, R.
المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :18-23 Jul, 2006
Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424402050
9781424402052
1424402069
9781424402069
تدمد:19461542
19461550
DOI:10.1109/IPFA.2006.250989