دورية أكاديمية
Integrating an Electron-Beam System into VLSI Fault Diagnosis
| العنوان: | Integrating an Electron-Beam System into VLSI Fault Diagnosis |
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| المؤلفون: | Tamama, T., Kuji, N. |
| المصدر: | IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 3(4):23-29 Aug, 1986 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07407475 15581918 |
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| DOI: | 10.1109/MDT.1986.294966 |