Physics of interfaces between gate electrodes and high-k dielectrics

التفاصيل البيبلوغرافية
العنوان: Physics of interfaces between gate electrodes and high-k dielectrics
المؤلفون: K. Shiraishi, H. Takeuchi, Y. Akasaka, T. Nakayama, S. Miyazaki, T. Nakaoka, A. Ohta, H. Watanabe, N. Umezawa, K. Ohmori, P. Ahmet, K. Toii, T. Chikyow, Y. Nara, T-J. King Liu, H. Iwai, K. Yamada
المصدر: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on. :384-387 Oct, 2006
Relation: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424401615
9781424401611
1424401607
9781424401604
DOI:10.1109/ICSICT.2006.306258