التفاصيل البيبلوغرافية
| العنوان: |
Study of electrically active defects in GaAs/InAs/GaAs QDs structures by DLTS and TEM |
| المؤلفون: |
Prezioso, M., Gombia, E., Mosca, R., Nasi, L., Motta, A., Frigeri, P., Trevisi, G., Seravalli, L., Franchi, S. |
| المصدر: |
2006 International Conference on Advanced Semiconductor Devices and Microsystems Advanced Semiconductor Devices and Microsystems, 2006. ASDAM '06. International Conference on. :237-240 Oct, 2006 |
| Relation: |
2006 International Conference on Advanced Semiconductor Devices and Microsystems |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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