مؤتمر
New Probing Technology Now Enables Impedance Controlled On-Wafer Probing
| العنوان: | New Probing Technology Now Enables Impedance Controlled On-Wafer Probing |
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| المؤلفون: | Wollitzer, M., Thies, S., Schott, S. |
| المصدر: | 2001 31st European Microwave Conference Microwave Conference, 2001. 31st European. :1-4 Sep, 2001 |
| Relation: | 2001 31st European Microwave Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| DOI: | 10.1109/EUMA.2001.339187 |
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