Underfill selection for reducing Cu/low-K delamination risk of flip-chip assembly

التفاصيل البيبلوغرافية
العنوان: Underfill selection for reducing Cu/low-K delamination risk of flip-chip assembly
المؤلفون: Tong Hong Wang, Yi-Shao Lai, Meng-Jen Wang
المصدر: 2006 8th Electronics Packaging Technology Conference Electronics Packaging Technology Conference, 2006. EPTC '06. 8th. :233-236 Dec, 2006
Relation: 2006 8th Electronics Packaging Technology Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424406641
9781424406647
142440665X
9781424406654
DOI:10.1109/EPTC.2006.342721