التفاصيل البيبلوغرافية
| العنوان: |
The Determination and Analysis of Aging Mechanisms in Accelerated Testing of Selected Semiconductors, Capacitors and Resistors |
| المؤلفون: |
Best, G. E., Bretts, G. R., Mclean, H. T., Lampert, H. M. |
| المصدر: |
Third Annual Symposium on the Physics of Failure in Electronics Physics of Failure in Electronics, 1964. Third Annual Symposium on the. :61-80 Sep, 1964 |
| Relation: |
Third Annual Symposium on the Physics of Failure in Electronics |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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