مؤتمر
A Highly Reliable FRAM (Ferroelectric Random Access Memory)
| العنوان: | A Highly Reliable FRAM (Ferroelectric Random Access Memory) |
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| المؤلفون: | Kim, J.-H., Jung, D. J., Kang, Y. M., Kim, H. H., Jung, W. W., Kang, J. Y., Lee, E. S., Kim, H., Jung, J. Y., Kang, S. K., Hong, Y. K., Kim, S. Y., Koh, H. K., Choi, D. Y., Park, J. H., Lee, S. Y., Jeong, H. S., Kim, K. |
| المصدر: | 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :554-557 Apr, 2007 |
| Relation: | 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1424409187 9781424409181 1424409195 9781424409198 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/RELPHY.2007.369950 |