مؤتمر
Quantitative analysis of Joule heating in surface micromachined Greek cross test structures
| العنوان: | Quantitative analysis of Joule heating in surface micromachined Greek cross test structures |
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| المؤلفون: | Enderling, S., Smith, S., Stevenson, J.T.M., Walton, A.J. |
| المصدر: | 2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :218-221 Mar, 2007 |
| Relation: | 2007 IEEE International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 142440780X 9781424407804 1424407818 9781424407811 |
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| تدمد: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2007.374487 |