Crystallographic texture evolution during processing of hot dipped and diffusion annealed high silicon electrical steel

التفاصيل البيبلوغرافية
العنوان: Crystallographic texture evolution during processing of hot dipped and diffusion annealed high silicon electrical steel
المؤلفون: Ros-Yanez, T., Barros, J., Houbaert, Y., Schneider, J.
المصدر: INTERMAG 2006 - IEEE International Magnetics Conference Magnetics Conference, 2006. INTERMAG 2006. IEEE International. :901-901 May, 2006
Relation: 2006 IEEE International Magnetics Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:1424414792
9781424414796
تدمد:21504598
21504601
DOI:10.1109/INTMAG.2006.374932