مؤتمر
Decentralized Approach to Diagnose Manufacturing Systems
| العنوان: | Decentralized Approach to Diagnose Manufacturing Systems |
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| المؤلفون: | Philippot, A., Sayed-Mouchaweh, M., Carre-Menetrier, V., Riera, B. |
| المصدر: | The Proceedings of the Multiconference on "Computational Engineering in Systems Applications" Computational Engineering in Systems Applications, IMACS Multiconference on. 1:912-918 Oct, 2006 |
| Relation: | The Proceedings of the Multiconference on "Computational Engineering in Systems Applications" |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 7302139229 9787302139225 7900718141 9787900718143 |
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| DOI: | 10.1109/CESA.2006.4281781 |