مؤتمر
Advanced high-K/metal gate charge trapping memories for post-45 nm node
العنوان: | Advanced high-K/metal gate charge trapping memories for post-45 nm node |
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المؤلفون: | Golubovic, D.S., Boutchich, M., Akil, N., Van Duuren, M.J. |
المصدر: | 2007 Non-Volatile Memory Technology Symposium Non-Volatile Memory Technology Symposium, 2007. NVMTS '07. :15-19 Nov, 2007 |
Relation: | 2007 Non-Volatile Memory Technology Symposium |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424413614 9781424413621 |
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DOI: | 10.1109/NVMT.2007.4389937 |