دورية أكاديمية
The Effects of Angle of Incidence and Temperature on Latchup in 65 nm Technology
| العنوان: | The Effects of Angle of Incidence and Temperature on Latchup in 65 nm Technology |
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| المؤلفون: | Hutson, J. M., Pellish, J. D., Boselli, G., Baumann, R., Reed, R. A., Schrimpf, R. D., Weller, R. A., Massengill, L. W. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 54(6):2541-2546 Dec, 2007 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2007.910330 |