Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance

التفاصيل البيبلوغرافية
العنوان: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance
المؤلفون: Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Alam, Muhammad A.
المصدر: 2007 IEEE/ACM International Conference on Computer-Aided Design Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on. :730-734 Nov, 2007
Relation: 2007 IEEE/ACM International Conference on Computer-Aided Design
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424413812
9781424413829
تدمد:10923152
15582434
DOI:10.1109/ICCAD.2007.4397352