مؤتمر
High Frequencies Characterization of High-K Insulators and their Impact on Architectures of MIM Capacitors in Advanced Integrated Circuits
العنوان: | High Frequencies Characterization of High-K Insulators and their Impact on Architectures of MIM Capacitors in Advanced Integrated Circuits |
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المؤلفون: | Lacrevaz, T., Vo, T. T., Piquet, J., Bermond, C., Flechet, B., Defay, E., Thomas, M., Farcy, A., Cueto, O., Torres, J. |
المصدر: | 2006 Conference on Optoelectronic and Microelectronic Materials and Devices Optoelectronic and Microelectronic Materials and Devices, 2006 Conference on. :41-44 Dec, 2006 |
Relation: | 2006 Conference on Optoelectronic and Microelectronic Materials and Devices |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424405770 9781424405787 |
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تدمد: | 10972137 23775505 |
DOI: | 10.1109/COMMAD.2006.4429874 |