دورية أكاديمية
Characteristics and Fluctuation of Negative Bias Temperature Instability in Si Nanowire Field-Effect Transistors
| العنوان: | Characteristics and Fluctuation of Negative Bias Temperature Instability in Si Nanowire Field-Effect Transistors |
|---|---|
| المؤلفون: | Wang, R., Huang, R., He, Y., Wang, Z., Jia, G., Kim, D.-W., Park, D., Wang, Y. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(3):242-245 Mar, 2008 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
|---|---|
| DOI: | 10.1109/LED.2007.915289 |