دورية أكاديمية
A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations
| العنوان: | A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations |
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| المؤلفون: | Nii, K., Yabuuchi, M., Tsukamoto, Y., Ohbayashi, S., Imaoka, S., Makino, H., Yamagami, Y., Ishikura, S., Terano, T., Oashi, T., Hashimoto, K., Sebe, A., Okazaki, S., Satomi, K., Akamatsu, H., Shinohara, H. |
| المصدر: | IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 43(1):180-191 Jan, 2008 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189200 1558173X |
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| DOI: | 10.1109/JSSC.2007.907998 |