Spacer etch optimization on high density memory products to eliminate core leakage failures

التفاصيل البيبلوغرافية
العنوان: Spacer etch optimization on high density memory products to eliminate core leakage failures
المؤلفون: Easwar Dharmarajan, Shengnian Song, Mclaughlin, Lenore, Guan, John, Gazda, Jerzy, Lin, Emma, Wen-Jie Qi, Hidehiko Shiraiwa, Hussey, James, Lansford, Jeremy, Basab Banerjee
المصدر: 2007 International Symposium on Semiconductor Manufacturing Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on. :1-4 Oct, 2007
Relation: 2007 International Symposium on Semiconductor Manufacturing
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424411412
9781424411429
تدمد:1523553X
DOI:10.1109/ISSM.2007.4446867