مؤتمر
On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit
| العنوان: | On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit |
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| المؤلفون: | Ghosh, Amlan, Rao, Rahul M., Kim, Jae-joon, Chuang, Ching-Te, Brown, Richard B. |
| المصدر: | 21st International Conference on VLSI Design (VLSID 2008) VLSI Design, 2008. VLSID 2008. 21st International Conference on. :143-149 Jan, 2008 |
| Relation: | 21st International Conference on VLSI Design |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769530834 9780769530833 |
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| تدمد: | 10639667 23806923 |
| DOI: | 10.1109/VLSI.2008.67 |