مؤتمر
Process variabilites and performances in a 90nm embedded SRAM
| العنوان: | Process variabilites and performances in a 90nm embedded SRAM |
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| المؤلفون: | San Min, Michael Yap, Maurine, Philippe, Bastian, Magali, Robert, Michel |
| المصدر: | 2007 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2007. IRW 2007. IEEE International. :135-138 Oct, 2007 |
| Relation: | 2007 IEEE International Integrated Reliability Workshop Final Report |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509084593 |
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| تدمد: | 19308841 23748036 |
| DOI: | 10.1109/IRWS.2007.4469240 |