دورية أكاديمية
Degradation Uniformity of RF-Power GaAs PHEMTs Under Electrical Stress
العنوان: | Degradation Uniformity of RF-Power GaAs PHEMTs Under Electrical Stress |
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المؤلفون: | Villanueva, A. A., del Alamo, J. A., Hisaka, T., Hayashi, K., Somerville, M. |
المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 8(2):283-288 Jun, 2008 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 15304388 15582574 |
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DOI: | 10.1109/TDMR.2008.920304 |