مؤتمر
A compact microstructure mechanical property measuring system
| العنوان: | A compact microstructure mechanical property measuring system |
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| المؤلفون: | Tao Chen, Lin Zhang, Jian Wu, Shibing Liu, Tiechuan Zuo |
| المصدر: | 2008 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on. :5-8 Jan, 2008 |
| Relation: | 2008 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424419074 9781424419081 |
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| DOI: | 10.1109/NEMS.2008.4484275 |