مؤتمر
Spacing impact on MOSFET mismatch
العنوان: | Spacing impact on MOSFET mismatch |
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المؤلفون: | Cathignol, A., Mennillo, S., Bordez, S., Vendrame, L., Ghibaudo, G. |
المصدر: | 2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :90-95 Mar, 2008 |
Relation: | 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424418008 9781424418015 |
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تدمد: | 10719032 21581029 |
DOI: | 10.1109/ICMTS.2008.4509320 |