مؤتمر
Reliability of advanced embedded non-volatile memories: The 2T-FNFN device
| العنوان: | Reliability of advanced embedded non-volatile memories: The 2T-FNFN device |
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| المؤلفون: | Guoqiao Tao |
| المصدر: | 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on. :79-82 Jun, 2008 |
| Relation: | 2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424418107 9781424418114 |
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| تدمد: | 23813555 |
| DOI: | 10.1109/ICICDT.2008.4567251 |