مؤتمر
Metal gate effects on a 32 nm metal gate resistor
| العنوان: | Metal gate effects on a 32 nm metal gate resistor |
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| المؤلفون: | Thuy Dao, Ik_Sung Lim, Connell, Larry, Triyoso, Dina H., Park, Youngbog, Mackenzie, Charlie |
| المصدر: | 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on. :109-112 Jun, 2008 |
| Relation: | 2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424418107 9781424418114 |
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| تدمد: | 23813555 |
| DOI: | 10.1109/ICICDT.2008.4567257 |