مؤتمر
Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories
| العنوان: | Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories |
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| المؤلفون: | Guoqiao Tao, Chauveau, Helene, Boter, Dick, van der Vegt, Erik, Dormans, Do, Verhaar, Rob |
| المصدر: | 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-5 Jul, 2008 |
| Relation: | 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424420391 9781424420407 |
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| تدمد: | 19461542 19461550 |
| DOI: | 10.1109/IPFA.2008.4588191 |