مؤتمر
Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories
| العنوان: | Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories |
|---|---|
| المؤلفون: | Guoqiao Tao, Chauveau, Helene, Boter, Dick, van der Vegt, Erik, Dormans, Do, Verhaar, Rob |
| المصدر: | 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-5 Jul, 2008 |
| Relation: | 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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