مؤتمر
Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure
العنوان: | Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure |
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المؤلفون: | Jung-Ho Kwon, Seon-Young Joo, Kyung-Jung Hwang, Jeong Woo Shin, Tae Wook Kim |
المصدر: | 2008 Third International Forum on Strategic Technologies Strategic Technologies, 2008. IFOST 2008. Third International Forum on. :53-57 Jun, 2008 |
Relation: | 2008 Third International Forum on Strategic Technologies (IFOST) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424423194 9781424423200 |
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DOI: | 10.1109/IFOST.2008.4602923 |