Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure

التفاصيل البيبلوغرافية
العنوان: Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure
المؤلفون: Jung-Ho Kwon, Seon-Young Joo, Kyung-Jung Hwang, Jeong Woo Shin, Tae Wook Kim
المصدر: 2008 Third International Forum on Strategic Technologies Strategic Technologies, 2008. IFOST 2008. Third International Forum on. :53-57 Jun, 2008
Relation: 2008 Third International Forum on Strategic Technologies (IFOST)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424423194
9781424423200
DOI:10.1109/IFOST.2008.4602923