مؤتمر
Scanning Capacitance Characterization of Potential Screening in InAs Nanowire Devices
| العنوان: | Scanning Capacitance Characterization of Potential Screening in InAs Nanowire Devices |
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| المؤلفون: | Law, James J. M., Dayeh, Shadi A., Wang, Deli, Yu, Edward T. |
| المصدر: | 2008 8th IEEE Conference on Nanotechnology Nanotechnology, 2008. NANO '08. 8th IEEE Conference on. :569-572 Aug, 2008 |
| Relation: | 2008 8th IEEE Conference on Nanotechnology (NANO) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424421039 9781424421046 |
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| تدمد: | 19449399 |
| DOI: | 10.1109/NANO.2008.168 |