مؤتمر
A unified approach for the reliability modeling of MOSFETs
العنوان: | A unified approach for the reliability modeling of MOSFETs |
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المؤلفون: | Chang-Ki Baek, SeongWook Choi, Hong-Hyun Park, Jun-Myung Woo, Young June Park, Sung-Min Hong, Chan Hyeong Park |
المصدر: | 2008 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on. :61-64 Sep, 2008 |
Relation: | 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424417537 |
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تدمد: | 19461569 19461577 |
DOI: | 10.1109/SISPAD.2008.4648237 |