مؤتمر
A unified approach for the reliability modeling of MOSFETs
| العنوان: | A unified approach for the reliability modeling of MOSFETs |
|---|---|
| المؤلفون: | Chang-Ki Baek, SeongWook Choi, Hong-Hyun Park, Jun-Myung Woo, Young June Park, Sung-Min Hong, Chan Hyeong Park |
| المصدر: | 2008 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on. :61-64 Sep, 2008 |
| Relation: | 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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