مؤتمر
Evaluation of the Schottky barrier parameters in the micron-size metal-semiconductor contacts
| العنوان: | Evaluation of the Schottky barrier parameters in the micron-size metal-semiconductor contacts |
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| المؤلفون: | Averin, S. V., Lyubchenko, V. E. |
| المصدر: | 2008 18th International Crimean Conference - Microwave & Telecommunication Technology Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference. :98-99 Sep, 2008 |
| Relation: | 2008 18th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2008) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9789663351667 9789663351698 |
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| DOI: | 10.1109/CRMICO.2008.4676305 |