مؤتمر
Low Power Test
| العنوان: | Low Power Test |
|---|---|
| المؤلفون: | Bahl, Swapnil, Sarkar, Rajiv, Garg, Akhil |
| المصدر: | 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-1 Oct, 2008 |
| Relation: | 2008 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424424023 9781424424030 |
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| تدمد: | 10893539 23782250 |
| DOI: | 10.1109/TEST.2008.4700682 |