مؤتمر
Bit parallel test pattern generation for path delay faults
| العنوان: | Bit parallel test pattern generation for path delay faults |
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| المؤلفون: | Henftling, M., Wittman, H. |
| المصدر: | Proceedings the European Design and Test Conference. ED&TC 1995 European design and test conference European Design and Test Conference, 1995. ED&TC 1995, Proceedings.. :521-525 1995 |
| Relation: | Proceedings the European Design and Test Conference. ED&TC 1995 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818670398 9780818670398 |
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| DOI: | 10.1109/EDTC.1995.470351 |