مؤتمر
BIST for embedded static RAMs with coverage calculation
| العنوان: | BIST for embedded static RAMs with coverage calculation |
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| المؤلفون: | van Sas, J., Van Wauwe, G., Huyskens, E., Rabaey, D. |
| المصدر: | Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :339-348 1993 |
| Relation: | Proceedings of IEEE International Test Conference - (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780314301 9780780314306 |
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| DOI: | 10.1109/TEST.1993.470679 |