A theoretical study Of electrostatic properties Of 〈100〉 uniaxially strained silicon n-channel MOSFET

التفاصيل البيبلوغرافية
العنوان: A theoretical study Of electrostatic properties Of 〈100〉 uniaxially strained silicon n-channel MOSFET
المؤلفون: Manzur Rahman, Md.
المصدر: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on. :142-145 Oct, 2008
Relation: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424421855
9781424421862
DOI:10.1109/ICSICT.2008.4734483