Morphology and microstructure evolution of AlxGa1-xN epilayers grown on GaN/sapphire templates with AlN interlayers observed by transmission electron microscopy

التفاصيل البيبلوغرافية
العنوان: Morphology and microstructure evolution of AlxGa1-xN epilayers grown on GaN/sapphire templates with AlN interlayers observed by transmission electron microscopy
المؤلفون: Lu, L., Shen, B., Xu, F.J., Huang, S., Miao, Z.L., Qin, Z.X., Yang, Z.J., Zhang, G.Y., Zhang, X.P., Xu, J., Yu, D.P.
المصدر: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on. :722-725 Oct, 2008
Relation: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424421855
9781424421862
DOI:10.1109/ICSICT.2008.4734633