مؤتمر
Destruction in the Active Part of an IGBT Chip Caused by Avalanche-Breakdown at the Edge Termination Structure
| العنوان: | Destruction in the Active Part of an IGBT Chip Caused by Avalanche-Breakdown at the Edge Termination Structure |
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| المؤلفون: | Knipper, U., Pfirsch, F., Raker, T., Niedermeyr, J., Wachutka, G. |
| المصدر: | 2008 International Conference on Advanced Semiconductor Devices and Microsystems Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on. :159-162 Oct, 2008 |
| Relation: | 2008 International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424423255 9781424423262 |
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| DOI: | 10.1109/ASDAM.2008.4743305 |