دورية أكاديمية
Characterization of Three-Terminal Junctions Operated as In-Plane Gated Field-Effect Transistors
| العنوان: | Characterization of Three-Terminal Junctions Operated as In-Plane Gated Field-Effect Transistors |
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| المؤلفون: | Muller, C. R., Worschech, L., Hofling, S., Forchel, A. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(2):306-311 Feb, 2009 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2009.2010571 |