دورية أكاديمية
Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices
| العنوان: | Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices |
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| المؤلفون: | Russo, U., Ielmini, D., Cagli, C., Lacaita, A. L. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(2):186-192 Feb, 2009 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2008.2010583 |