مؤتمر
Experimental verification and analysis for noise isolation of analog and digital chip-package-PCB hierarchical power distribution network
| العنوان: | Experimental verification and analysis for noise isolation of analog and digital chip-package-PCB hierarchical power distribution network |
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| المؤلفون: | Park, Hyunjeong, Jongjoo Shim, Yujeong Shim, Yoo, Jeongsik, Kim, Joungho |
| المصدر: | 2008 IEEE 9th VLSI Packaging Workshop of Japan VLSI Packaging Workshop of Japan, 2008. VPWJ 2008. IEEE 9th. :73-76 Dec, 2008 |
| Relation: | 2008 IEEE 9th VLSI Packaging Workshop of Japan |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424434985 |
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| تدمد: | 23735449 |
| DOI: | 10.1109/VPWJ.2008.4762211 |