مؤتمر
Quantifying ESD/EOS latent damage and integrated circuit leakage currents
| العنوان: | Quantifying ESD/EOS latent damage and integrated circuit leakage currents |
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| المؤلفون: | Miryeong Song, Eng, D.C., MacWilliams, K.P. |
| المصدر: | Electrical Overstress/Electrostatic Discharge Symposium Proceedings Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995. :304-310 1995 |
| Relation: | Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 1878303597 9781878303592 |
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| DOI: | 10.1109/EOSESD.1995.478298 |