Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents

التفاصيل البيبلوغرافية
العنوان: Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
المؤلفون: Martin-Martinez, J., Kaczer, B., Boix, J., Ayala, N., Rodriguez, R., Nafria, M., Aymerich, X., Zuber, P., Dierickx, B., Groeseneken, G.
المصدر: 2009 Spanish Conference on Electron Devices Electron Devices, 2009. CDE 2009. Spanish Conference on. :156-159 Feb, 2009
Relation: 2009 Spanish Conference on Electron Devices (CDE)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424428380
9781424428397
تدمد:21634971
DOI:10.1109/SCED.2009.4800454