مؤتمر
Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
العنوان: | Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents |
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المؤلفون: | Martin-Martinez, J., Kaczer, B., Boix, J., Ayala, N., Rodriguez, R., Nafria, M., Aymerich, X., Zuber, P., Dierickx, B., Groeseneken, G. |
المصدر: | 2009 Spanish Conference on Electron Devices Electron Devices, 2009. CDE 2009. Spanish Conference on. :156-159 Feb, 2009 |
Relation: | 2009 Spanish Conference on Electron Devices (CDE) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781424428380 9781424428397 |
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تدمد: | 21634971 |
DOI: | 10.1109/SCED.2009.4800454 |