دورية أكاديمية
An Empirical Comparison of Spatial Randomness Models for Yield Analysis
| العنوان: | An Empirical Comparison of Spatial Randomness Models for Yield Analysis |
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| المؤلفون: | Fellows, H. H., Mastrangelo, C. M., White, K. P. |
| المصدر: | IEEE Transactions on Electronics Packaging Manufacturing IEEE Trans. Electron. Packag. Manufact. Electronics Packaging Manufacturing, IEEE Transactions on. 32(2):115-120 Apr, 2009 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 1521334X 15580822 |
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| DOI: | 10.1109/TEPM.2009.2015768 |