مؤتمر
Variability aware modeling of SoCs: From device variations to manufactured system yield
| العنوان: | Variability aware modeling of SoCs: From device variations to manufactured system yield |
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| المؤلفون: | Miranda, M., Dierickx, B., Zuber, P., Dobrovoln, P., Kutscherauer, F., Roussel, P., Poliakov, P. |
| المصدر: | 2009 10th International Symposium on Quality Electronic Design Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design. :547-553 Mar, 2009 |
| Relation: | 2009 10th International Symposium on Quality Electronic Design (ISQED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424429523 9781424429530 |
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| تدمد: | 19483287 19483295 |
| DOI: | 10.1109/ISQED.2009.4810353 |